IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of backside grooving on leakage loss of conductor-backed coplanar waveguide

APMC 2001. 2001 Asia-Pacific Microwave Conference

Author(s): M. Hotta ; M. Kobayashi ; T. Inoue ; M. Hano ; T. Sakane
Sponsor(s): Minstr. Educ.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 3 December 2001
Volume: 2
Page Count: 4
ISBN (Paper): 0-7803-7138-0
DOI: 10.1109/APMC.2001.985502
Regular:

Leakage loss of grooving conductor backed coplanar waveguide (CBCPW) has been analysed by using the hybrid 2D-FDTD Method and the curve-fitting procedure. From numerical results, it has been... View More

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