IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian Confidence Limits For The Availability of Systems

Author(s): W. E. Thompson ; P. A. Palicio
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1975
Volume: R-24
Page(s): 118 - 120
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1975.5215109
Regular:

This paper presents a numerical procedure for computing Bayes confidence intervals for the availability of a series or parallel system consisting of several statistically independent 2-state... View More

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