IEC - International Electrotechnical Commission - IEC 62951-8:2023
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 19 January 2023 |
| Status: | published |
| Page Count: | 14 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include... View More
Document History
IEC 62951-8:2023
January 19, 2023
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include...