IEC - International Electrotechnical Commission - IEC 62951-9:2022
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 14 December 2022 |
| Status: | published |
| Page Count: | 18 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this... View More
Document History
IEC 62951-9:2022
December 14, 2022
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document...