IEC - International Electrotechnical Commission - IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 29 March 2023 |
| Status: | published |
| Page Count: | 30 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the... View More
Document History
IEC 63287-2:2023
March 29, 2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the...