IEC - International Electrotechnical Commission - IEC 63364-1:2022
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 14 December 2022 |
| Status: | published |
| Page Count: | 24 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection... View More
Document History
IEC 63364-1:2022
December 14, 2022
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection...