IEC - International Electrotechnical Commission - IEC 62899-503-3:2021
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 24 August 2021 |
| Status: | published |
| Page Count: | 13 |
| ICS Code (Semiconducting materials): | 29.045 |
| ICS Code (Transistors): | 31.080.30 |
abstract:
IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a... View More
Document History
IEC 62899-503-3:2021
August 24, 2021
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test...