IEC - International Electrotechnical Commission - IEC 62047-42:2022
Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 16 September 2022 |
| Status: | published |
| Page Count: | 22 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62047-42:2022 specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film on microcantilever, which is typical structure of actual micro sensors and... View More
Document History
IEC 62047-42:2022
September 16, 2022
Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
IEC 62047-42:2022 specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film on microcantilever, which is typical structure of actual micro sensors and...