IEC - International Electrotechnical Commission - IEC 62047-40:2021
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 3 September 2021 |
| Status: | published |
| Page Count: | 11 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechani
Document History
IEC 62047-40:2021
September 3, 2021
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial...