IEC - International Electrotechnical Commission - IEC 62047-38:2021
Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 23 June 2021 |
| Status: | published |
| Page Count: | 12 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62047-38:2021(E) specifies a test method for measuring the adhesion strength of metal powder paste in the electrical interconnection between micro-electromechani
Document History
IEC 62047-38:2021
June 23, 2021
Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
IEC 62047-38:2021(E) specifies a test method for measuring the adhesion strength of metal powder paste in the electrical interconnection between micro-electromechanical systems (MEMS) and a circuit...