IEC - International Electrotechnical Commission - IEC 62047-38:2021

Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 23 June 2021
Status: published
Page Count: 12
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 62047-38:2021(E) specifies a test method for measuring the adhesion strength of metal powder paste in the electrical interconnection between micro-electromechanical systems (MEMS) and a... View More

Document History

IEC 62047-38:2021
June 23, 2021
Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
IEC 62047-38:2021(E) specifies a test method for measuring the adhesion strength of metal powder paste in the electrical interconnection between micro-electromechanical systems (MEMS) and a circuit...
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