IEC - International Electrotechnical Commission - IEC 60747-14-11:2021

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 3 March 2021
Status: published
Page Count: 21
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based... View More

Document History

IEC 60747-14-11:2021
March 3, 2021
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based...
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