IEEE - Institute of Electrical and Electronics Engineers, Inc. - Common mode failure analysis

Author(s): W.C. Gangloff
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1975
Volume: 94
Page(s): 27 - 30
ISSN (Paper): 0018-9510
DOI: 10.1109/T-PAS.1975.31820
Regular:

Standard Reliability analysis techniques have demonstrated the capability to evaluate system vulnerability to random component failures. Recently, in the nuclear power industry, interest has been... View More

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