IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modified Generalized Sign Test Processor for 2-D Radar

Author(s): G.V. Trunk ; B.H. Cantrell ; F.D. Queen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1974
Volume: AES-10
Page(s): 574 - 582
ISSN (Paper): 0018-9251
DOI: 10.1109/TAES.1974.307848
Regular:

The modified generalized sign test processor is a nonparametric, adaptive detector for 2-D search radars. The detector ranks a sample under test with its neighboring samples and integrates (on a... View More

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