IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Distance Metric Exploiting Heterogeneous Interattribute Relationship for Ordinal-and-Nominal-Attribute Data Clustering

Author(s): Yiqun Zhang ; Yiu-Ming Cheung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Electronic): 2168-2275
ISSN (Paper): 2168-2267
DOI: 10.1109/TCYB.2020.2983073
Regular:

Ordinal attribute has all the common characteristics of a nominal one but it differs from the nominal one by having naturally ordered possible values (also called categories interchangeably). In... View More

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