IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Comparison of the In-Situ Measurement of Terrestrial Americium with a Ge(Li) Spectrometer and a Fidler

Author(s): Stephen J. Roth ; George Huckabay
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1974
Volume: 21
Page(s): 438 - 443
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1974.4327495
Regular:

The evaluation of the sensitivity of a Ge(Li) coaxial detector in comparison with a thin NaI(Tl) detector in in situ terrestrial 241Am is described. The experiment was performed in areas of... View More

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