IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Criterion Based on an Information Theoretic Measure for Goodness of Fit between Classifier and Data Base

Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1974
Volume: SMC-4
Page(s): 492 - 495
ISSN (Paper): 0018-9472
ISSN (Online): 2168-2909
DOI: 10.1109/TSMC.1974.4309350
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