IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uniformity Evaluation of Temperature Field in an Oven Based on Image Processing

Author(s): Conghui Wang ; Bochuan Hou ; Jing Shi ; Jianhua Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 8
Page(s): 10,243 - 10,253
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2962783
Regular:

Non-uniform temperature distributions in ovens affect the quality of baked goods and raise concerns regarding food safety. Traditional research on oven performance focuses on the heating... View More

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