IEEE - Institute of Electrical and Electronics Engineers, Inc. - Complex Permittivity Measurement System for Solid Materials Using Complementary Frequency Selective Surfaces

Author(s): Chih-Kuo Lee ; Shiyu Zhang ; Syed Sheheryar Bukhari ; Darren Cadman ; J. C. Vardaxoglou ; William G. Whittow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 8
Page(s): 7,628 - 7,640
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2020.2963919
Regular:

This paper describes a novel method of characterizing complex permittivity using a complementary frequency selective surface (CFSS). The CFSS provides a passband behavior and the change in the... View More

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