IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiple Soft Fault Diagnosis of Analog Filter Circuit Based on Genetic Algorithm

Author(s): Chenglin Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 8
Page(s): 8,193 - 8,201
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2020.2964054
Regular:

Hard (open and short) faults and discrete parameter faults (DPF) are the mostly used fault models in simulation-before-test (SBT) method. Because that the parameter of analog element is... View More

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