IEEE - Institute of Electrical and Electronics Engineers, Inc. - NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction

Author(s): Tianmei Li ; Xiaosheng Si ; Zonghao Yang ; Hong Pei ; Yuzhe Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 8
Page(s): 9,072 - 9,083
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2962528
Regular:

Over the last several years, many testability growth models (TGMs) have been developed to greatly facilitate engineers and managers in tracking and measuring the growth of testability as system is... View More

Advertisement