IEEE - Institute of Electrical and Electronics Engineers, Inc. - Normalization-Based Validity Index of Adaptive K-Means Clustering for Multi-Solution Application

Author(s): Tao Li ; Yitao Ma ; Tetsuo Endoh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 8
Page(s): 9,403 - 9,419
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2020.2964763
Regular:

Validity evaluation aims to analyze the quality of the clustering algorithm with different measurement criteria. A variety of assessment methods have been introduced in the application of pattern... View More

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