IEEE - Institute of Electrical and Electronics Engineers, Inc. - Source camera identification with dual-tree complex wavelet transform

Author(s): Hui Zeng ; Yongcai Wan ; Kang Deng ; Anjie Peng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2020.2968855
Regular:

Sensor pattern noise (SPN) extraction is a critical stage of the sensor based source camera identification (SCI). However, the quality of the extracted SPN with the traditional discrete wavelet... View More

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