IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data-driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network

Author(s): Huahui Yang ; Chen Meng ; Cheng Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2020.2968744
Regular:

The present study applies the one-dimensional convolutional neural network (1D-CNN) to propose an intelligent approach of the feature extraction for the analog circuit diagnosis. The raw signals... View More

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