IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rethinking Triplet Loss for Domain Adaptation

Author(s): Weijian Deng ; Liang Zheng ; Yifan Sun ; Jianbin Jiao
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2205
ISSN (Paper): 1051-8215
DOI: 10.1109/TCSVT.2020.2968484
Regular:

The gap in data distribution motivates domain adaptation research. In this area, image classification intrinsically requires the source and target features to be co-located if they are of the same... View More

Advertisement