IEEE - Institute of Electrical and Electronics Engineers, Inc. - SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations

Author(s): Rui Zhang ; Taizhi Liu ; Kexin Yang ; Chang-Chih Chen ; Linda Milor
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Electronic): 1557-9999
ISSN (Paper): 1063-8210
DOI: 10.1109/TVLSI.2019.2956923
Regular:

Bias temperature instability (BTI), hot carrier injection (HCI), gate-oxide time-dependent dielectric breakdown (GTDDB), and random telegraph noise (RTN) degrade the stability of the deeply scaled... View More

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