IEEE - Institute of Electrical and Electronics Engineers, Inc. - Blind Image Quality Assessment Using a Deep Bilinear Convolutional Neural Network

Author(s): Weixia Zhang ; Kede Ma ; Jia Yan ; Dexiang Deng ; Zhou Wang
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 30
Page(s): 36 - 47
ISSN (Electronic): 1558-2205
ISSN (Paper): 1051-8215
DOI: 10.1109/TCSVT.2018.2886771
Regular:

We propose a deep bilinear model for blind image quality assessment that works for both synthetically and authentically distorted images. Our model constitutes two streams of deep convolutional... View More

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