IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Site Meta-Analysis of Morphometry

Author(s): Neda Jahanshad ; M. Arfan Ikram ; Marcel P. Zwiers ; Alejandro Arias Vasquez ; Barbara Franke ; Jennifer L. Kroll ; Benson Mwangi ; Jair C. Soares ; Alex Ing ; Sylvane Desrivieres ; Gunter Schumann ; Joshua Faskowitz ; Narelle K. Hansell ; Greig I. de Zubicaray ; Katie L. McMahon ; Nicholas G. Martin ; Margaret J. Wright ; Paul M. Thompson ; Gennady Roshchupkin ; Derrek P. Hibar ; Boris A. Gutman ; Nicholas J. Tustison ; Hieab H. H. Adams ; Wiro J. Niessen ; Meike W. Vernooij
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2019
Volume: 16
Page(s): 1,508 - 1,514
ISSN (CD): 2374-0043
ISSN (Electronic): 1557-9964
ISSN (Paper): 1545-5963
DOI: 10.1109/TCBB.2019.2914905
Regular:

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