IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Low-Latency Multi-Touch Detector Based on Concurrent Processing of Redesigned Overlap Split and Connected Component Analysis

Author(s): Byeong Yong Kong ; Jooseung Lee ; In-Cheol Park
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 67
Page(s): 166 - 176
ISSN (Electronic): 1558-0806
ISSN (Paper): 1549-8328
DOI: 10.1109/TCSI.2019.2946584
Regular:

A low-latency multi-touch detector architecture for locating numerous touches in large-panel devices is presented in this paper. Two respective processors for the overlap split and the connected... View More

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