IEEE - Institute of Electrical and Electronics Engineers, Inc. - Padding of Multicycle Broadside and Skewed-Load Tests

Author(s): Irith Pomeranz
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2019
Volume: 27
Page(s): 2,587 - 2,595
ISSN (Electronic): 1557-9999
ISSN (Paper): 1063-8210
DOI: 10.1109/TVLSI.2019.2924319
Regular:

Multicycle tests achieve test compaction by increasing the number of clock cycles between scan operations and reducing the number of tests. Tests in a compact multicycle test set typically have... View More

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