IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dual-Mode Noise-Reconstructed EMD for Weak Feature Extraction and Fault Diagnosis of Rotating Machinery

Author(s): Jing Yuan ; Huiming Jiang ; Qian Zhao ; Chong Xu ; Haijiang Liu ; Yongxiang Tian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2956766
Regular:

The meaningful data-based fault diagnosis is beforehand revealing the potential faults to reduce the costly breakdowns, one challenging of which is extracting the weak features from the... View More

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