IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability Analysis via Non-Gaussian State-Space Models

Author(s): Thiago Rezende dos Santos ; Dani Gamerman ; Glaura da Conceicao Franco
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Volume: 66
Page(s): 309 - 318
ISSN (Electronic): 1558-1721
ISSN (Paper): 0018-9529
DOI: 10.1109/TR.2017.2670142
Regular:

This paper proposes new reliability models whose likelihood consists of decomposition of data information in stages or times, thus leading to latent state parameters. Alternative versions of some... View More

Advertisement