IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Structural Average of Labeled Merge Trees for Uncertainty Visualization

Author(s): Lin Yan ; Yusu Wang ; Elizabeth Munch ; Ellen Gasparovic ; Bei Wang
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Comput. Graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2020
Volume: 26
Page(s): 832 - 842
ISSN (CD): 2160-9306
ISSN (Electronic): 1941-0506
ISSN (Paper): 1077-2626
DOI: 10.1109/TVCG.2019.2934242
Regular:

Physical phenomena in science and engineering are frequently modeled using scalar fields. In scalar field topology, graph-based topological descriptors such as merge trees, contour trees, and Reeb... View More

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