IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impacts and Contributors of Representativeness Errors of $In~Situ$ Albedo Measurements for the Validation of Remote Sensing Products

Author(s): Xiaodan Wu ; Jianguang Wen ; Qing Xiao ; Dongqin You ; Xingwen Lin ; Shengbiao Wu ; Shouyi Zhong
Sponsor(s): IEEE Geoscience and Remote Sensing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2019
Volume: 57
Page(s): 9,740 - 9,755
ISSN (Electronic): 1558-0644
ISSN (Paper): 0196-2892
DOI: 10.1109/TGRS.2019.2928954
Regular:

Validation of remote sensing albedo products involves comparisons between point-scale in situ observations and footprint-scale satellite retrievals. However, the observed differences between... View More

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