IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Level Metric Learning Network for Fine-Grained Classification

Author(s): Jiabao Wang ; Yang Li ; Zhuang Miao ; Xun Zhao ; Zhang Rui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 166,390 - 166,397
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2953957
Regular:

The application of fine-grained image classification can be problematic due to subtle differences between classes. The existing global feature-based methods have worse accuracies than regional... View More

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