IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Uniformity in Nb/NbxSi1-x/Nb Josephson Junctions

Author(s): Ian W. Haygood ; Eric R. J. Edwards ; Anna E. Fox ; Matthew R. Pufall ; Michael L. Schneider ; William H. Rippard ; Paul D. Dresselhaus ; Samuel P. Benz
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2019
Volume: 29
Page(s): 1 - 5
ISSN (CD): 2378-7074
ISSN (Electronic): 1558-2515
ISSN (Paper): 1051-8223
DOI: 10.1109/TASC.2019.2922225
Regular:

The uniformity of the barriers in Josephson junctions (JJs) is a critical parameter in determining performance and operating margins for a wide variety of superconducting electronic circuits. We... View More

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