IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Micro-multifocus X-ray Source Based On Electron Beam Scanning For Multi-view Stationary Micro Computed Tomography

Author(s): Kang An ; Yi Fan Yin ; Fukun Li ; Limin Shi ; Xiaolong Hu ; Jie Tang ; Rifeng Zhou
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-0563
ISSN (Paper): 0741-3106
DOI: 10.1109/LED.2019.2955089
Regular:

We developed a new prototype micro-multifocus Xray source based on electron beam scanning (MMFEBS) for multiview stationary Micro Computed Tomography (multi-view stationary Micro-CT). This... View More

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