IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Analytical Gate Delay Model in Near/Subthreshold Domain Considering Process Variation

Author(s): Peng Cao ; Zhiyuan Liu ; Jingjing Guo ; Jiangping Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2955091
Regular:

Voltage scaling technique is widely employed in state-of-the-art low power circuits with excellent power reduction. However, voltage scaling to sub-threshold (STV) and near-threshold (NTV) domain... View More

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