IEEE - Institute of Electrical and Electronics Engineers, Inc. - Requirements-driven Test Generation for Autonomous Vehicles with Machine Learning Components

Author(s): Cumhur Erkan Tuncali ; Georgios Fainekos ; Danil Prokhorov ; Hisahiro Ito ; James Kapinski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2379-8904
ISSN (Paper): 2379-8858
DOI: 10.1109/TIV.2019.2955903
Regular:

Autonomous vehicles are complex systems that are challenging to test and debug. A requirements-driven approach to the development process can decrease the resources required to design and test... View More

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