IEEE - Institute of Electrical and Electronics Engineers, Inc. - Amplitude Difference Changes Based Metrological Scheme for Force Detection in A Mode-localized 5-beam Array

Author(s): Shuyi Liu ; Dong F. Wang ; Di Zhou ; Jing Hong ; Maeda Ryutaro
Sponsor(s): IEEE Sensors Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2379-9153
ISSN (Electronic): 1558-1748
ISSN (Paper): 1530-437X
DOI: 10.1109/JSEN.2019.2955151
Regular:

In this paper, amplitude difference changes (abbreviated as Madc) is proposed as a metrological scheme to characterize a coupled 5-beam array for force detection application for the first time. A... View More

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