IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Diagnosis in Industrial Processes by Maximizing Pairwise Kullback-Leibler Divergence

Author(s): Qiugang Lu ; Benben Jiang ; Eranda Harinath
Sponsor(s): IEEE Control Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 6
ISSN (CD): 2374-0159
ISSN (Electronic): 1558-0865
ISSN (Paper): 1063-6536
DOI: 10.1109/TCST.2019.2950403
Regular:

Fault diagnosis gains increasing attention for its ability to enhance process safety and efficiency. This brief proposes a maximized ratio divergence analysis (MRDA) approach for fault diagnosis,... View More

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