IEEE - Institute of Electrical and Electronics Engineers, Inc. - Differential Evolution Fitting-Based Optical Step Phase Thermography for Micron Thickness Measurement of Atmospheric Corrosion Layer

Author(s): Lishuai Liu ; Chenjun Guo ; Yanxin Tu ; Hongwei Mei ; Liming Wang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0050
ISSN (Paper): 1551-3203
DOI: 10.1109/TII.2019.2955493
Regular:

This work introduces differential evolution fitting-based optical step phase thermography for fast, contactless, and high-accurate measurement of micron thickness, which is widely needed in... View More

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