IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-Supervised Multi-Label Deep Learning based Non-intrusive Load Monitoring in Smart Grids

Author(s): Yandong Yang ; Jing Zhong ; Wei Li ; T. Aaron Gulliver ; Shufang Li
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0050
ISSN (Paper): 1551-3203
DOI: 10.1109/TII.2019.2955470
Regular:

Non-intrusive load monitoring (NILM) is a technique that infers appliance-level energy consumption patterns and operation state changes based on feeder power signals. With the availability of... View More

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