IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cross Term Decay in Multiplicative Processors

Author(s): Vaibhav Chavali ; Kathleen Wage
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2361
ISSN (Paper): 1070-9908
DOI: 10.1109/LSP.2019.2955815
Regular:

Multiplicative processors combine the beamformed outputs of undersampled subarrays to estimate the spatial power spectrum. While the multiplicative processor requires fewer sensors to achieve the... View More

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