IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of Bayesian Network Characteristics to Link Project Management Maturity and Risk of Project Overcost

2018 14th International Conference on Signal-Image Technology & Internet-Based Systems (SITIS)

Author(s): Felipe Sanchez ; Davy Monticolo ; Eric Bonjour ; Jean-Pierre Micaelli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Las Palmas de Gran Canaria, Spain, Spain
Conference Date: 26 November 2018
Page(s): 420 - 426
ISBN (Electronic): 978-1-5386-9385-8
DOI: 10.1109/SITIS.2018.00071
Regular:

The project management field has the imperative to increase the project probability of success. Experts have developed several project management maturity models to assets and improve the project... View More

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