IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accounting for the Dependence of Coil Sensitivity on Sample Thickness and Lift-Off in Inductively Coupled Photoconductance Measurements

Author(s): Lachlan E. Black ; Daniel H. Macdonald
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2019
Volume: 9
Page(s): 1,563 - 1,574
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2942484
Regular:

Inductively coupled photoconductance measurements are widely used to characterize carrier recombination in crystalline silicon. We show that, contrary to what is usually supposed, the sensitivity... View More

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