IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hypothesis Test for Bounds on the Size of Random Defective Set

Author(s): Arkadii D'yachkov ; Nikita Polyanskii ; Vladislav Shchukin ; Ilya Vorobyev
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 15 November 2019
Volume: 67
Page(s): 5,775 - 5,784
ISSN (Electronic): 1941-0476
ISSN (Paper): 1053-587X
DOI: 10.1109/TSP.2019.2940120
Regular:

The conventional model of disjunctive group testing assumes that there are several defective elements (or defectives) among a large population, and a group test yields the positive response if and... View More

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