IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Two-Stage Deep Learning Method for Robust Shape Reconstruction with Electrical Impedance Tomography

Author(s): Shangjie Ren ; Kai Sun ; Chao Tan ; Feng Dong
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2954722
Regular:

As a non-invasive and radiation-free imaging modality, electrical impedance tomography (EIT) has attracted much attention in the last two decades and owns many industry and biomedical... View More

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