IEEE - Institute of Electrical and Electronics Engineers, Inc. - Grammar Based Directed Testing of Machine Learning Systems

Author(s): Sakshi Sunil Udeshi ; Sudipta Chattopadhyay
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2019.2953066
Regular:

The massive progress of machine learning has seen its application over a variety of domains in the past decade. But how do we develop a systematic, scalable and modular strategy to validate... View More

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