IEEE - Institute of Electrical and Electronics Engineers, Inc. - DMS: Dynamic Model Scaling for Quality-Aware Deep Learning Inference in Mobile and Embedded Devices

Author(s): Woochul Kang ; Daeyeon Kim ; Junyoung Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2954546
Regular:

Recently, deep learning has brought revolutions to many mobile and embedded systems that interact with the physical world using continuous video streams. Although there have been significant... View More

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