IEEE - Institute of Electrical and Electronics Engineers, Inc. - Review of Loss Distribution, Analysis and Measurement Techniques for GaN HEMTs

Author(s): Jacob Gareau ; Ruoyu Hou ; Ali Emadi
Sponsor(s): IEEE Power Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0107
ISSN (Paper): 0885-8993
DOI: 10.1109/TPEL.2019.2954819
Regular:

In recent years, there has been a trend for improved performance in semiconductor switches, allowing power electronic systems to achieve higher efficiency and higher power density. This desired... View More

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